Search results
Results from the WOW.Com Content Network
Strasser studied chemistry at the University of Tübingen, at Stanford University (), and at the University of Pisa and obtained his Diplom in Physical Chemistry in 1995. He conducted his doctoral research under the direction of Gerhard Ertl and obtained his PhD in Physical Chemistry and Electrochemistry from the Fritz Haber Institute of the Max Planck Society in 1999. [2]
Heterogeneous OER is sensitive to the surface which the reaction takes place and is also affected by the pH of the solution. The general mechanism for acidic and alkaline solutions is shown below.
Peter Strasser may refer to: Peter Strasser (1876–1918), German aviation leader in World War I; Peter Strasser (chemist) (born 1969), German chemist;
The electrochemical promotion of catalysis (EPOC) effect in the realm of chemistry refers to the pronounced enhancement of catalytic reactions or significant changes in the catalytic properties of a conductive catalyst in the presence of electrical currents or interfacial potentials.
The Fellowship of the Australian Academy of Science is made up of about 500 Australian scientists.. Scientists judged by their peers to have made an exceptional contribution to knowledge in their field may be elected to Fellowship of the Academy.
Strasser did not live to see the end of the war. On 5 August 1918, [3] during a night raid against Boston, Norwich, and the Humber Estuary, Strasser's L 70 met a British reconnaissance D.H.4. [4] Pilot Major Egbert Cadbury and Gunner Major Robert Leckie shot down the L 70 just north of Wells-next-the-Sea on the Norfolk coast. None of the 23 men ...
Peter Richard Schreiner (born 17 November 1965 in Nuremberg, Germany) is a German chemist who is a professor at Justus Liebig University Giessen. As of 2022 [update] , his h-index is 73. [ 1 ]
Texture can be determined by various methods. [5] Some methods allow a quantitative analysis of the texture, while others are only qualitative. Among the quantitative techniques, the most widely used is X-ray diffraction using texture goniometers, followed by the electron backscatter diffraction (EBSD) method in scanning electron microscopes.