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This is a list of companies in the Chicago metropolitan area. The Chicago metropolitan area – also known as "Chicagoland" – is the metropolitan area associated with the city of Chicago , Illinois , and its suburbs. [ 2 ]
Technoprobe was founded in Merate near Milan in 1996 by Giuseppe Crippa, who had developed a new and more rapid method to manufacture probe cards. [2] As the company grew, it opened manufacturing and sales offices abroad, including in Rousset, France (2001), Singapore (2003), San Jose, California (2007), Philippines (2010), Korea (2015), and Japan (2018).
Probe cards are broadly classified into needle type, vertical type, and MEMS (Micro Electro-Mechanical System) [4] type depending on shape and forms of contact elements. MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown.
IRVINE, Calif.--(BUSINESS WIRE)-- Probe Manufacturing, Inc., (OTC QB : PMFI), a global electronics design & manufacturing services company, ranked 9th in the Orange County Business Journal's 2012 ...
The company completed an initial public offering (IPO) on the Nasdaq as FORM, [2] in June 2003 with 6 million shares priced at $14. [3] [4] FormFactor released the first x64 DRAM probe card in 2000, [5] followed by the x128 DRAM probe card in 2002. [6] [7] The company shipped the first SmartMatrix full-wafer probe cards in February 2009. [8]
Onto Innovation Inc. is an American semiconductor company formed in 2019 from the merger of Rudolph Technologies, Inc. and Nanometrics Incorporated. Onto Innovation is traded as NYSE: ONTO on the New York Stock Exchange, it is a provider of process and process control equipment and software for microelectronic manufacturing industries (primarily semiconductor).
US6847218 – Probe card with an adapter layer for testing integrated circuits [61] 2006 US7045387 – Method of performing back-end manufacturing of an integrated circuit [62] 2007 US7227804 – Current source architecture for memory device standby current reduction [63] 2008 US2008315847 – Programmable floating gate reference [64]
the probe card may be damaged from repeated contact, or become contaminated with debris created by contact with the wafer [2] the probe will act as a circuit and affect the results of the test. For this reason, the tests performed at wafer sort cannot always be identical and as extensive as those performed at the final device test after ...