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In this technique, the states are assigned in a binary sequence where the states are numbered starting from 0 and up. The number of flip-flops used is equal to the number bits (b). Since binary encoding uses the minimum number of bits (flip-flops) to encode a machine, the flip-flops are maximally utilized.
An alternative solution to clock gating is to use Clock Enable (CE) logic on synchronous data path employing the input multiplexer, e.g., for D type flip-flops: using C / Verilog language notation: Dff= CE? D: Q; where: Dff is D-input of D-type flip-flop, D is module information input (without CE input), Q is D-type flip-flop output.
The output of a flip-flop is constant until a pulse is applied to its "clock" input, upon which the input of the flip-flop is latched into its output. In a synchronous logic circuit, an electronic oscillator called the clock generates a string (sequence) of pulses, the "clock signal".
If the output of the flip-flop is low, and a high clock pulse is applied with the input being a low pulse, then there is no need for a state transition. The extra computation to sample the inputs cause an increase in setup time of the flip-flop; this is a disadvantage of this technique.
Synchronizers may take the form of a cascade of D flip-flops (e.g. the shift register in Figure 3). [7] Although each flip-flop stage adds an additional clock cycle of latency to the input data stream, each stage provides an opportunity to resolve metastability. Such synchronizers can be engineered to reduce metastability to a negligible but ...
Setting J = K = 0 maintains the current state. To synthesize a D flip-flop, simply set K equal to the complement of J (input J will act as input D). Similarly, to synthesize a T flip-flop, set K equal to J. The JK flip-flop is therefore a universal flip-flop, because it can be configured to work as an SR flip-flop, a D flip-flop, or a T flip-flop.
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Not all faults can be analyzed using the stuck-at fault model. Compensation for static hazards, namely branching signals, can render a circuit untestable using this model. Also, redundant circuits cannot be tested using this model, since by design there is no change in any output as a result of a single fault.