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A diffraction pattern of a red laser beam projected onto a plate after passing through a small circular aperture in another plate. Diffraction is the deviation of waves from straight-line propagation without any change in their energy due to an obstacle or through an aperture.
Same double-slit assembly (0.7 mm between slits); in top image, one slit is closed. In the single-slit image, a diffraction pattern (the faint spots on either side of the main band) forms due to the nonzero width of the slit. This diffraction pattern is also seen in the double-slit image, but with many smaller interference fringes.
When the diffracting object has a periodic structure, for example in a diffraction grating, the features generally become sharper. The fourth figure, for example, shows a comparison of a double-slit pattern with a pattern formed by five slits, both sets of slits having the same spacing between the center of one slit and the next.
Diffraction patterns arise because the paths sum differently at different detector positions. According to these principles the Airy disk and diffraction pattern can be computed numerically by using Feynman photon path integrals to determine the detection probability at different points in the focal plane of a parabolic mirror. [14]
A diffraction grating can be considered to be a multiple-beam interferometer; since the peaks which it produces are generated by interference between the light transmitted by each of the elements in the grating; see interference vs. diffraction for further discussion.
This equation, Bragg's law, describes the condition on θ for constructive interference. [12] A map of the intensities of the scattered waves as a function of their angle is called a diffraction pattern. Strong intensities known as Bragg peaks are obtained in the diffraction pattern when the scattering angles satisfy Bragg condition.
Close to an aperture or atoms, often called the "sample", the electron wave would be described in terms of near field or Fresnel diffraction. [12]: Chpt 7-8 This has relevance for imaging within electron microscopes, [1]: Chpt 3 [2]: Chpt 3-4 whereas electron diffraction patterns are measured far from the sample, which is described as far-field or Fraunhofer diffraction. [12]:
which is the generalized diffraction grating equation. Here, θ m is the angle of incidence, φ m is the angle of diffraction, λ is the wavelength, and m = 0, 1, 2... is the order of diffraction. Under certain conditions, d m ≪ λ, which can be readily obtained experimentally, the phase term becomes [7] [10]