Search results
Results from the WOW.Com Content Network
The company completed an initial public offering (IPO) on the Nasdaq as FORM, [2] in June 2003 with 6 million shares priced at $14. [3] [4] FormFactor released the first x64 DRAM probe card in 2000, [5] followed by the x128 DRAM probe card in 2002. [6] [7] The company shipped the first SmartMatrix full-wafer probe cards in February 2009. [8]
FormFactor (FORM) announces the opening of a new probe card manufacturing facility in Livermore, CA, in a bid to bolster its presence in the United States.
Use and manufacture. A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE .
2020 Becomes the world's second largest probe cards manufacturer [2] [6] [7] [8] 2021 Opens a new research and development facility for Microfabrica technologies in Agrate Brianza [9] 2022 Technoprobe becomes a public company, on February 15 the shares are available for trading on Milan's stock exchange; [10] opens a new R&D center near Catania ...
Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or ...
Example of an approximately 40,000 probe spotted oligo microarray with enlarged inset to show detail. Microarray analysis techniques are used in interpreting the data generated from experiments on DNA (Gene chip analysis), RNA, and protein microarrays, which allow researchers to investigate the expression state of a large number of genes – in many cases, an organism's entire genome – in a ...
the probe card may be damaged from repeated contact, or become contaminated with debris created by contact with the wafer the probe will act as a circuit and affect the results of the test. For this reason, the tests performed at wafer sort cannot always be identical and as extensive as those performed at the final device test after packaging ...
Single-subject design. In design of experiments, single-subject curriculum or single-case research design is a research design most often used in applied fields of psychology, education, and human behaviour in which the subject serves as his/her own control, rather than using another individual/group. Researchers use single-subject design ...