enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. Reference designator - Wikipedia

    en.wikipedia.org/wiki/Reference_designator

    IEEE 200-1975 or "Standard Reference Designations for Electrical and Electronics Parts and Equipments" is a standard that was used to define referencing naming systems for collections of electronic equipment. IEEE 200 was ratified in 1975. The IEEE renewed the standard in the 1990s, but withdrew it from active support shortly thereafter.

  3. Glossary of electrical and electronics engineering - Wikipedia

    en.wikipedia.org/wiki/Glossary_of_electrical_and...

    A diode intended for regular operation in the reverse, avalanche breakdown, mode. Used as a voltage reference, noise source, and in certain classes of microwave oscillator device. average rectified value The average value of an alternating current waveform, taking the absolute value of the waveform. The average value is generally different from ...

  4. High voltage - Wikipedia

    en.wikipedia.org/wiki/High_voltage

    The high voltage section is kept physically distant from the low voltage side to reduce the possibility of an arc forming between the two. To avoid coronal losses, conductors are kept as short as possible and free of sharp points. If insulated, the plastic coating should be free of air bubbles which result in coronal discharges within the bubbles.

  5. Discover the best free online games at AOL.com - Play board, card, casino, puzzle and many more online games while chatting with others in real-time.

  6. Broadcom forecasts Q1 revenue above estimates on strong AI ...

    www.aol.com/news/broadcom-forecasts-first...

    By Arsheeya Bajwa and Zaheer Kachwala (Reuters) -Broadcom forecast quarterly revenue above Wall Street estimates on Thursday and predicted booming demand for its custom artificial intelligence ...

  7. QBD (electronics) - Wikipedia

    en.wikipedia.org/wiki/QBD_(electronics)

    QBD is the term applied to the charge-to-breakdown measurement of a semiconductor device. It is a standard destructive test method used to determine the quality of gate oxides in MOS devices. It is equal to the total charge passing through the dielectric layer (i.e. electron or hole fluence multiplied by the elementary charge) just before failure.

  8. Freddie Freeman's walk-off grand slam ball sells for $1.56 ...

    www.aol.com/freddie-freemans-walk-off-grand...

    Freddie Freeman’s historic walk-off grand slam ball from Game 1 of the World Series has sold for $1.56 million at auction. The bidding at SCP Auctions went into the late hours of Saturday night ...

  9. Voltage spike - Wikipedia

    en.wikipedia.org/wiki/Voltage_spike

    For sensitive electronics, excessive current can flow if this voltage spike exceeds a material's breakdown voltage, or if it causes avalanche breakdown. In semiconductor junctions , excessive electric current may destroy or severely weaken that device.