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Mikrokator 509–4 C.E Johansson Eskilstuna Sweden. A Johansson Mikrokator (also called Abramson's movement) is a mechanical comparator used to obtain mechanical magnification of the difference in length as compared to a standard.
In metrology and the fields that it serves (such as manufacturing, machining, and engineering), total indicator reading (TIR), also known by the newer name full indicator movement (FIM), is the difference between the maximum and minimum measurements, that is, readings of an indicator, on the planar, cylindrical, or contoured surface of a part ...
Conducting Research: NPL conducts research in various fields of physics, including metrology, materials science, and nanotechnology. Providing Calibration and Testing Services: NPL offers calibration and testing services to industries and other organizations to help them maintain product quality and comply with regulatory standards.
Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form, surface fractality, and surface finish (including surface roughness) are the parameters most commonly associated with the field. It is important to many disciplines and is mostly known for the machining of precision ...
Surface roughness, often shortened to roughness, is a component of surface finish (surface texture).It is quantified by the deviations in the direction of the normal vector of a real surface from its ideal form.
The range or the engineering tolerance does not affect the measurement, but is an important factor in evaluating the viability of the measurement system. Parts or specimens (what is being measured), some items are easier to be measured than others. A measurement system may be good for measuring steel block length but not for measuring rubber ...
ISO 10012:2003, Measurement management systems - Requirements for measurement processes and measuring equipment is the International Organization for Standardization (ISO) standard that specifies generic requirements and provides guidance for the management of measurement processes and metrological confirmation of measuring equipment used to support and demonstrate compliance with metrological ...
Interferometry typically uses electromagnetic waves and is an important investigative technique in the fields of astronomy, fiber optics, engineering metrology, optical metrology, oceanography, seismology, spectroscopy (and its applications to chemistry), quantum mechanics, nuclear and particle physics, plasma physics, biomolecular interactions ...