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The scanning helium microscope (SHeM) is a form of microscopy that uses low-energy (5–100 meV) neutral helium atoms to image the surface of a sample without any damage to the sample caused by the imaging process. Since helium is inert and neutral, it can be used to study delicate and insulating surfaces.
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A scanning helium ion microscope (SHIM, HeIM or HIM) is an imaging technology based on a scanning helium ion beam. [2] Similar to other focused ion beam techniques, it allows to combine milling and cutting of samples with their observation at sub-nanometer resolution.
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Helium is composed of two electrons bound by the electromagnetic force to a nucleus containing two protons along with two neutrons, depending on the isotope, held together by the strong force. Unlike for hydrogen , a closed-form solution to the Schrödinger equation for the helium atom has not been found.
Liquid helium is a physical state of helium at very low temperatures at standard atmospheric pressures.Liquid helium may show superfluidity.. At standard pressure, the chemical element helium exists in a liquid form only at the extremely low temperature of −269 °C (−452.20 °F; 4.15 K).
Field ion microscope image of the end of a sharp platinum needle. Each bright spot is a platinum atom. The field-ion microscope (FIM) was invented by Müller in 1951. [1] It is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip.
Scanning helium microscope may refer to: Scanning helium microscopy; Scanning Helium Ion Microscope; Atomic nanoscope, which was proposed and discussed in the literature, but is not yet competitive with optical microscope, electron microscope, Scanning Helium Ion Microscope and various scanning probe microscopes