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Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves.
The schematic representation of a nano-FTIR system with a broadband infrared source. Nano-FTIR (nanoscale Fourier transform infrared spectroscopy) is a scanning probe technique that utilizes as a combination of two techniques: Fourier transform infrared spectroscopy (FTIR) and scattering-type scanning near-field optical microscopy (s-SNOM).
One main challenge in apertureless NSOM/FTIR is a strong background signal because the scattering is obtained from both near-field and remote area of the probe. Thus, the small near-field contribution to the signal has to be extracted from the background. One solution is to use a very flat sample with only optical spatial fluctuation. [55]
Snom Technology GmbH / s n ʊ m / is a German company which manufactures Voice over Internet Protocol (VoIP) telephones, based on the IETF standard Session Initiation Protocol (SIP). Snom's products are targeted at the small- to medium-sized business sector, home offices , Internet service providers , carriers , and original equipment ...
Nanophotonics or nano-optics is the study of the behavior of light on the nanometer scale, and of the interaction of nanometer-scale objects with light. It is a branch of optics, optical engineering, electrical engineering, and nanotechnology.
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level.
Editor’s Note: In Snap, we look at the power of a single photograph, chronicling stories about how both modern and historical images have been made. By his own admission, James Crombie knew ...
Micrasterias furcata imaged in transmitted DIC microscopy Laser-induced optical damage in LiNbO 3 under 150× Nomarski microscopy. Differential interference contrast (DIC) microscopy, also known as Nomarski interference contrast (NIC) or Nomarski microscopy, is an optical microscopy technique used to enhance the contrast in unstained, transparent samples.