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  2. Surface roughness - Wikipedia

    en.wikipedia.org/wiki/Surface_roughness

    Areal roughness parameters are defined in the ISO 25178 series. The resulting values are Sa, Sq, Sz,... Many optical measurement instruments are able to measure the surface roughness over an area. Area measurements are also possible with contact measurement systems. Multiple, closely spaced 2D scans are taken of the target area.

  3. Surface metrology - Wikipedia

    en.wikipedia.org/wiki/Surface_metrology

    Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form , surface fractality , and surface finish (including surface roughness ) are the parameters most commonly associated with the field.

  4. Profilometer - Wikipedia

    en.wikipedia.org/wiki/Profilometer

    A profilometer is a measuring instrument used to measure a surface's profile, in order to quantify its roughness. Critical dimensions as step, curvature, flatness are computed from the surface topography.

  5. Taylor Hobson - Wikipedia

    en.wikipedia.org/wiki/Taylor_Hobson

    Taylor Hobson is an English company founded in 1886 and located in Leicester, England.Originally a manufacturer of still camera and cine lenses, the company now manufactures precision metrology instruments—in particular, profilometers for the analysis of surface textures and forms.

  6. Surface finish - Wikipedia

    en.wikipedia.org/wiki/Surface_finish

    Surface finish, also known as surface texture or surface topography, is the nature of a surface as defined by the three characteristics of lay, surface roughness, and waviness. [1] It comprises the small, local deviations of a surface from the perfectly flat ideal (a true plane ).

  7. White light scanner - Wikipedia

    en.wikipedia.org/wiki/White_light_scanner

    A white light scanner (WLS) is a device for performing surface height measurements of an object using coherence scanning interferometry with spectrally-broadband, "white light" illumination. Different configurations of scanning interferometer may be used to measure macroscopic objects with surface profiles measuring in the centimeter range, to ...

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