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An RF admittance level sensor uses a rod probe and RF source to measure the change in admittance. The probe is driven through a shielded coaxial cable to eliminate the effects of changing cable capacitance to ground. When the level changes around the probe, a corresponding change in the dielectric is observed.
It does this by reducing the input voltage to a safe, measurable level with a precision voltage divider circuit within the probe body. Probes intended for up to 100 kV typically employ a resistor voltage divider, with an input resistance of hundreds or thousands of megohms to minimize circuit loading. High linearity and accuracy is achieved by ...
Langmuir probe measurements are based on the estimation of current versus voltage characteristics of a circuit consisting of two metallic electrodes that are both immersed in the plasma under study. Two cases are of interest: (a) The surface areas of the two electrodes differ by several orders of magnitude. This is known as the single-probe ...
In digital and analog circuits, a single event may cause one or more voltages pulses (i.e. glitches) to propagate through the circuit, in which case it is referred to as a single-event transient (SET). Since the propagating pulse is not technically a change of "state" as in a memory SEU, one should differentiate between SET and SEU.
The suggested setting for the configuration shown, is with R1 = R2, and R3 around the middle of the range of the RTD. Looking at the Wheatstone bridge circuit shown, the voltage drop on the lower left hand side is V_rtd + V_lead, and on the lower righthand side is V_R3 + V_lead, therefore the bridge voltage (V_b) is the difference, V_rtd − V ...
In a high resistance grounded distribution system, a feeder may develop a fault to ground but the system continues in operation. The faulted, but energized, feeder can be found with a ring-type current transformer collecting all the phase wires of the circuit; only the circuit containing a fault to ground will show a net unbalanced current. To ...
These can manifest only at specific environmental conditions, high clock speeds, low power supply voltages, and sometimes specific circuit signal states; significant variations can occur on a single die. [9] Overstress-induced damage like ohmic shunts or a reduced transistor output current can increase such delays, leading to erratic behavior.
The configuration is like the neutron probe where an access tube made of PVC is installed in the soil; probes can also be modular (comb-like) and connected to a logger. The sensing head consists of an oscillator circuit, the frequency is determined by an annular electrode, fringe-effect capacitor, and the dielectric constant of the soil. Each ...