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A silicon-controlled switch (SCS) behaves nearly the same way as an SCR; but there are a few differences. Unlike an SCR, an SCS switches off when a positive voltage/input current is applied to another anode gate lead. Unlike an SCR, an SCS can be triggered into conduction when a negative voltage/output current is applied to that same lead.
The surge is defined by the Combination Wave Generator's open-circuit voltage and short-circuit current waveforms, characterized by front time, duration, and peak values. With an open circuit output, the surge voltage is a double exponential pulse in the form of k ( e − α t − e − β t ) {\displaystyle k(e^{-\alpha t}-e^{-\beta t})} .
The SCR can be calculated for each point on an electrical grid. A point on a grid having a number of machines with an SCR above a number between 1 and 1.5 has less vulnerability to voltage instability. Hence, such a grid is known strong grid or power system. A power system (grid) having a lower SCR has more vulnerability to grid voltage ...
In graphical analysis of nonlinear electronic circuits, a load line is a line drawn on the current–voltage characteristic graph for a nonlinear device like a diode or transistor. It represents the constraint put on the voltage and current in the nonlinear device by the external circuit.
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.
In electrical engineering, an electrical isolation test is a direct current (DC) or alternating current (AC) resistance test that is performed on sub-systems of an electronic system to verify that a specified level of isolation resistance is met. Isolation testing may also be conducted between one or more electrical circuits of the same ...
A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components, such as diodes, transistors, thyristors, and vacuum tubes. The device contains voltage and current sources that can be used to stimulate the device under test (DUT).
A worst-case circuit analysis should be performed on all circuitry that is safety and financially critical. Worst-case circuit analysis is an analysis technique which, by accounting for component variability, determines the circuit performance under a worst-case scenario (under extreme environmental or operating conditions).