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Structural equation modeling (SEM) is a diverse set of methods used by scientists for both observational and experimental research. SEM is used mostly in the social and behavioral science fields, but it is also used in epidemiology, [2] business, [3] and other fields. A common definition of SEM is, "...a class of methodologies that seeks to ...
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
The partial least squares path modeling or partial least squares structural equation modeling (PLS-PM, PLS-SEM) [1] [2] [3] is a method for structural equation modeling that allows estimation of complex cause-effect relationships in path models with latent variables.
Electron channelling contrast imaging (ECCI) is a scanning electron microscope (SEM) diffraction technique used in the study of defects in materials. These can be dislocations or stacking faults that are close to the surface of the sample, low angle grain boundaries or atomic steps.
The first STEM was built in 1938 by Baron Manfred von Ardenne, [2] [3] working in Berlin for Siemens.However, at the time the results were inferior to those of transmission electron microscopy, and von Ardenne only spent two years working on the problem.
Scanning confocal electron microscopy (SCEM) is an electron microscopy technique analogous to scanning confocal optical microscopy (SCOM). In this technique, the studied sample is illuminated by a focussed electron beam, as in other scanning microscopy techniques, such as scanning transmission electron microscopy or scanning electron microscopy.
High-angle annular dark-field imaging (HAADF) is a STEM technique which produces an annular dark field image formed by very high angle, incoherently scattered electrons (Rutherford scattered from the nucleus of the atoms) — as opposed to Bragg scattered electrons.
Security event management (SEM), and the related SIM and SIEM, are computer security disciplines that use data inspection tools to centralize the storage and interpretation of logs or events generated by other software running on a network.