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In mathematics, especially in linear algebra and matrix theory, the duplication matrix and the elimination matrix are linear transformations used for transforming half-vectorizations of matrices into vectorizations or (respectively) vice versa.
Process of elimination is a logical method to identify an entity of interest among several ones by excluding all other entities. In educational testing , it is a process of deleting options whereby the possibility of an option being correct is close to zero or significantly lower compared to other options.
For a symmetric matrix A, the vector vec(A) contains more information than is strictly necessary, since the matrix is completely determined by the symmetry together with the lower triangular portion, that is, the n(n + 1)/2 entries on and below the main diagonal.
The use of a sequence of experiments, where the design of each may depend on the results of previous experiments, including the possible decision to stop experimenting, is within the scope of sequential analysis, a field that was pioneered [12] by Abraham Wald in the context of sequential tests of statistical hypotheses. [13]
A/B testing (also known as bucket testing, split-run testing, or split testing) is a user experience research method. [1] A/B tests consist of a randomized experiment that usually involves two variants (A and B), [ 2 ] [ 3 ] [ 4 ] although the concept can be also extended to multiple variants of the same variable.
A(standard) is the peak area of analyte in the absence of matrix. The concentration of analyte in both standards should be the same. A matrix effect value close to 100 indicates absence of matrix influence. A matrix effect value of less than 100 indicates suppression, while a value larger than 100 is a sign of matrix enhancement.
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The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.