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The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern.
A powder X-ray diffractometer in motion. X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions.
The incoming beam (coming from upper left) causes each scatterer to re-radiate a small portion of its intensity as a spherical wave. If scatterers are arranged symmetrically with a separation d, these spherical waves will be in sync (add constructively) only in directions where their path-length difference 2d sin θ equals an integer multiple of the wavelength λ.
Typically, powder X-ray diffraction (XRD) is an average of randomly oriented microcrystals that should equally represent all crystal orientation if a large enough sample is present. X-rays are directed at the sample while slowly rotated that produce a diffraction pattern that shows intensity of x-rays collected at different angles. Randomly ...
An early graphing calculator was designed in 1921 by electrical engineer Edith Clarke. [1] [2] [3] The calculator was used to solve problems with electrical power line transmission. [4] Casio produced the first commercially available graphing calculator in 1985. Sharp produced its first graphing calculator in 1986, with Hewlett Packard ...
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
Diffraction topography (short: "topography") is an imaging technique based on Bragg diffraction.Diffraction topographic images ("topographies") record the intensity profile of a beam of X-rays (or, sometimes, neutrons) diffracted by a crystal.
Three-dimensional X-ray diffraction (3DXRD) is a microscopy technique using hard X-rays (with energy in the 30-100 keV range) to investigate the internal structure of polycrystalline materials in three dimensions.