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A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods, oscilloscope probes and current probes. A test probe is often supplied as a test lead ...
A universal logic probe. Flying probes are test probes used for testing both bare circuit boards and boards loaded with components. Flying probes were introduced in the late 1980’s and can be found in many manufacturing and assembly operations, most often in manufacturing of electronic printed circuit boards. A flying probe tester uses one or ...
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.
The wafer prober brings an array of microscopic needles or probes called a probe card into electrical contact with the wafer (vacuum-mounted on a wafer chuck). WPT and WFT use different probe cards, the WFT card contacts a chip's bond pads. After each test the prober moves the wafer to the next testing location.
An electrical meter with integral AC current clamp is known as a clamp meter, clamp-on ammeter, tong tester, or colloquially as an amp clamp. A clamp meter measures the vector sum of the currents flowing in all the conductors passing through the probe, which depends on the phase relationship of the currents. Only one conductor is normally ...
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
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