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Instance selection (or dataset reduction, or dataset condensation) is an important data pre-processing step that can be applied in many machine learning (or data mining) tasks. [1] Approaches for instance selection can be applied for reducing the original dataset to a manageable volume, leading to a reduction of the computational resources that ...
An associative classifier (AC) is a kind of supervised learning model that uses association rules to assign a target value. The term associative classification was coined by Bing Liu et al., [1] in which the authors defined a model made of rules "whose right-hand side are restricted to the classification class attribute".
Classification algorithms (3 C, 85 P) Cluster analysis algorithms (42 P) Pages in category "Data mining algorithms" The following 6 pages are in this category, out of ...
With no applied treatments (rules), the desired class represents only 21% of the class distribution. However, if one filters the data set for houses with 6.7 to 9.78 rooms and a neighborhood parent-teacher ratio of 12.6 to 16, then 97% of the remaining examples fall into the desired class (high-quality houses).
There have been some efforts to define standards for the data mining process, for example, the 1999 European Cross Industry Standard Process for Data Mining (CRISP-DM 1.0) and the 2004 Java Data Mining standard (JDM 1.0). Development on successors to these processes (CRISP-DM 2.0 and JDM 2.0) was active in 2006 but has stalled since.
In machine learning and statistical classification, multiclass classification or multinomial classification is the problem of classifying instances into one of three or more classes (classifying instances into one of two classes is called binary classification). For example, deciding on whether an image is showing a banana, an orange, or an ...
The rule that covers the most positive examples and the least negative examples are chosen as the best rule of the current seed example. It allows the best rule to cover some negative examples to handle the increase flexibility and reduce the overfitting problem and noisy data in the rule induction.
An example of data mining related to an integrated-circuit (IC) production line is described in the paper "Mining IC Test Data to Optimize VLSI Testing." [12] In this paper, the application of data mining and decision analysis to the problem of die-level functional testing is described. Experiments mentioned demonstrate the ability to apply a ...