Search results
Results from the WOW.Com Content Network
Download as PDF; Printable version; ... Electron Imcroscopy Image Contest: ... Media in category "Electron microscope images" The following 3 files are in this ...
Beyond this, the user should be aware of their possible existence during the evaluation of results. Usually, these effects appear on the images in various forms due to different electron beam-specimen interactions and processes. [52] The introduction of gas in an electron microscope is tantamount to a new dimension.
4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point ...
Surface plasmon resonance (SPR) Surface plasmon resonance (SPR) is a phenomenon that occurs where electrons in a thin metal sheet become excited by light that is directed to the sheet with a particular angle of incidence, and then travel parallel to the sheet.
Charge coupled device (CCD) cameras were first applied to transmission electron microscopy in the 1980s and later became widespread. [3] [4] For use in a TEM, CCDs are typically coupled with a scintillator such as single crystal Yttrium aluminium garnet (YAG) in which electrons from the electron beam are converted to photons, which are then transferred to the sensor of the CCD via a fiber ...
Main page; Contents; Current events; Random article; About Wikipedia; Contact us
The EM Data Bank or Electron Microscopy Data Bank (EMDB) collects 3D EM maps and associated experimental data determined using electron microscopy of biological specimens. It was established in 2002 at the MSD/PDBe group of the European Bioinformatics Institute (EBI) , where the European site of the EMDataBank.org consortium is located. [ 2 ]
Electron channelling contrast imaging (ECCI) is a scanning electron microscope (SEM) diffraction technique used in the study of defects in materials. These can be dislocations or stacking faults that are close to the surface of the sample, low angle grain boundaries or atomic steps.