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  2. Test engineer - Wikipedia

    en.wikipedia.org/wiki/Test_engineer

    Depending on the product, the machines that we are referring to could mean a combination of Automatic Test Equipment (ATE), handler, interface board, and test program that drives the ATE, as with the case of the IC chip testing. Test automation is a big part of a test engineer's job. The whole intention of automating the test is as follows:

  3. Compatibility testing - Wikipedia

    en.wikipedia.org/wiki/Compatibility_testing

    The degree to which a product can perform its required functions efficiently while sharing a common environment and resources with other products, without detrimental impact on any other product is known as co-existence while interoperability is the degree to which two or more systems, products, or components can exchange information and use ...

  4. Test automation - Wikipedia

    en.wikipedia.org/wiki/Test_automation

    Test automation tools can be expensive and are usually employed in combination with manual testing. Test automation can be made cost-effective in the long term, especially when used repeatedly in regression testing. A good candidate for test automation is a test case for common flow of an application, as it is required to be executed ...

  5. Product testing - Wikipedia

    en.wikipedia.org/wiki/Product_testing

    The advent of product testing was the beginning of the modern consumer movement. Product testing might be accomplished by a manufacturer, an independent laboratory, a government agency, etc. Often an existing formal test method is used as a basis for testing. Other times engineers develop methods of test which are suited to the specific purpose.

  6. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.

  7. Classification Tree Method - Wikipedia

    en.wikipedia.org/wiki/Classification_Tree_Method

    The minimum number of test cases is the number of classes in the classification with the most containing classes. In the second step, test cases are composed by selecting exactly one class from every classification of the classification tree. The selection of test cases originally [3] was a manual task to be performed by the test engineer.

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