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A Kerr microscope relies on the MOKE in order to image differences in the magnetization on a surface of magnetic material. In a Kerr microscope, the illuminating light is first passed through a polarizer filter, then reflects from the sample and passes through an analyzer polarizing filter, before going through a regular optical microscope ...
MFM images of 3.2 Gb and 30 Gb computer hard-drive surfaces. Comparison of Faraday-effect image (left) and MFM image (inset, lower-right) of a magnetic film. Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the ...
Michael Faraday holding a piece of glass of the type he used to demonstrate the effect of magnetism on polarization of light, c. 1857.. By 1845, it was known through the work of Augustin-Jean Fresnel, Étienne-Louis Malus, and others that different materials are able to modify the direction of polarization of light when appropriately oriented, [4] making polarized light a very powerful tool to ...
In general, magneto-optic effects break time reversal symmetry locally (i.e., when only the propagation of light, and not the source of the magnetic field, is considered) as well as Lorentz reciprocity, which is a necessary condition to construct devices such as optical isolators (through which light passes in one direction but not the other).
intensity of light magnetometer: strength of magnetic fields manometer: pressure of gas mass flow meter: mass flow rate of a fluid travelling through a tube mass spectrometer: masses of ions, used to identify chemical substances through their mass spectra measuring cup: liquid and dry goods measuring cylinder: volume measuring spoon
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...
Atomic resolution imaging of SrTiO 3, using annular dark field (ADF) and annular bright field (ABF) detectors. Overlay: strontium (green), titanium (grey), and oxygen (red). In scanning TEM (STEM), a focused probe is rastered over an area of interest, and a signal is recorded at each probe position to form an image. This typically requires ...
Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic state of a material. The SHPM can also image magnetic induction under applied fields up to ~1 tesla and over a wide range of temperatures (millikelvins to 300 K). [3] The SHPM can be used to image many types of magnetic structures such as thin ...
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