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A. R. Forouhi and I. Bloomer deduced dispersion equations for the refractive index, n, and extinction coefficient, k, which were published in 1986 [1] and 1988. [2] The 1986 publication relates to amorphous materials, while the 1988 publication relates to crystalline.
Amorphous silicon (a-Si) is the non-crystalline form of silicon used for solar cells and thin-film transistors in LCDs.. Used as semiconductor material for a-Si solar cells, or thin-film silicon solar cells, it is deposited in thin films onto a variety of flexible substrates, such as glass, metal and plastic.
These parameters approximate amorphous silicon. [1] The Forouhi–Bloomer model is a mathematical formula for the frequency dependence of the complex-valued refractive index. The model can be used to fit the refractive index of amorphous and crystalline semiconductor and dielectric materials at energies near and greater than their optical band gap.
The refractive index of materials varies with the wavelength (and frequency) of light. [27] This is called dispersion and causes prisms and rainbows to divide white light into its constituent spectral colors. [28] As the refractive index varies with wavelength, so will the refraction angle as light goes from one material to another.
Refraction at interface. Many materials have a well-characterized refractive index, but these indices often depend strongly upon the frequency of light, causing optical dispersion. Standard refractive index measurements are taken at the "yellow doublet" sodium D line, with a wavelength (λ) of 589 nanometers.
The behaviour of light-sensitive defect passivation in amorphous silicon networks has been a topic of study since the discovery of the Staebler–Wronski effect in 1977. [120] Staebler and Wronski found a gradual decrease in photoconductivity and dark conductivity of amorphous silicon thin films upon exposure to light for several hours. This ...
In a birefringent material, a wave consists of two polarization components which generally are governed by different effective refractive indices. The so-called slow ray is the component for which the material has the higher effective refractive index (slower phase velocity), while the fast ray is the one with a lower effective refractive index ...
Silicon is transparent to infrared light with wavelengths above about 1.1 micrometres. [58] Silicon also has a very high refractive index, of about 3.5. [58] The tight optical confinement provided by this high index allows for microscopic optical waveguides, which may have cross-sectional dimensions of only a few hundred nanometers. [10]