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RIGOL was founded in Beijing in 1998 and released its first product, a high-performance virtual digital storage oscilloscope, in May 1999. [1]In 2018 the company released the new RSA5000 real-time spectrum analyzer and the MSO7000, as well as MSO5000 series, based on the new ASIC based Ultravision-II platform.
Extreme ultraviolet lithography (EUVL, also known simply as EUV) is a technology used in the semiconductor industry for manufacturing integrated circuits (ICs). It is a type of photolithography that uses 13.5 nm extreme ultraviolet (EUV) light from a laser-pulsed tin (Sn) plasma to create intricate patterns on semiconductor substrates.
In 2002, Aeroflex acquired IFR Systems Inc, a test equipment manufacturer from Wichita, Kansas, originally founded in 1937. [6] In 1998, IFR previously acquired Marconi Instruments, a British test equipment manufacturer. [7] In 2007, Aeroflex was taken private by a group of private equity firms including Veritas Capital, Golden Gate Capital, GS ...
Mentor Graphics to Provide Tessent Silicon Test, Yield Analysis, Calibre Physical Verification and DFM for Freescale WILSONVILLE, Ore.--(BUSINESS WIRE)-- Mentor Graphics Corp. (NAS: MENT) today ...
If R 1 represents a clean freshly prepared surface (e.g., after a cleavage in vacuum) and R 2 the same sample after the exposure to hydrogen or oxygen contaminants, the ΔR/R spectrum can be related to features of the clean surface (e.g., surface states); [2] if R 1 is the reflectivity spectrum of a sample covered by an organic film (even if ...
Eagle Test Systems was founded by Len Foxman and began providing test solutions in 1976. Since October 1, 2003, they have delivered over 600 test systems to more than 60 customers worldwide. Prior to being acquired by Teradyne, global headquarters were located at its manufacturing facility in Buffalo Grove, Illinois. There, Eagle Test Systems ...
An illustration of geometrical parameters in the visible-near Infrared (VNIR) reflectance spectrum of montmorillonite, a clay mineral. Modified from Clark et al., 2007. [15] The analysis of absorption features in a reflectance spectrum typically looks into the position (P), depth (D), and width (W) of absorption bands across a certain ...
For example, in the late 1980s, Therma-Wave, Inc. introduced the "Therma-Probe" photo-modulated reflectance system to the market for semiconductor process control equipment. The original Therma-Probe focused an intensity modulated pump laser beam onto a spot on a silicon sample, modulating the sample reflectance.
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