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An illustration of geometrical parameters in the visible-near Infrared (VNIR) reflectance spectrum of montmorillonite, a clay mineral. Modified from Clark et al., 2007. [15] The analysis of absorption features in a reflectance spectrum typically looks into the position (P), depth (D), and width (W) of absorption bands across a certain ...
Reflectance and transmittance measurements of the uncoated glass substrate were needed in order to determine the previously unknown n(λ) and k(λ) spectra of the glass. The reflectance and transmittance of ITO deposited on the same glass substrate were then measured simultaneously, and analyzed using the Forouhi–Bloomer equations.
If R 1 represents a clean freshly prepared surface (e.g., after a cleavage in vacuum) and R 2 the same sample after the exposure to hydrogen or oxygen contaminants, the ΔR/R spectrum can be related to features of the clean surface (e.g., surface states); [2] if R 1 is the reflectivity spectrum of a sample covered by an organic film (even if ...
For example, in the late 1980s, Therma-Wave, Inc. introduced the "Therma-Probe" photo-modulated reflectance system to the market for semiconductor process control equipment. The original Therma-Probe focused an intensity modulated pump laser beam onto a spot on a silicon sample, modulating the sample reflectance.
If the instrument is designed to measure the spectrum on an absolute scale rather than a relative one, then it is typically called a spectrophotometer. The majority of spectrophotometers are used in spectral regions near the visible spectrum. A spectrometer that is calibrated for measurement of the incident optical power is called a ...
Typical materials for ATR crystals include germanium, KRS-5 and zinc selenide, while silicon is ideal for use in the Far-IR region of the electromagnetic spectrum. The excellent mechanical properties of diamond make it an ideal material for ATR, particularly when studying very hard solids, although the broad diamond phonon band between 2600 and ...
and are the reflectance in two different polarizations. The method was introduced in 1985 for the study optical properties of the cubic semiconductors silicon and germanium . [ 3 ] Due to its high surface sensitivity and independence of ultra-high vacuum , its use has been expanded to in situ monitoring of epitaxial growth [ 4 ] or the ...
A Forward Silicon Vertex Detector (FVTX) sensor of PHENIX detector on a microscope showing silicon strips spacing at 75 microns. [3] Most silicon particle detectors work, in principle, by doping narrow (usually around 100 micrometers wide) silicon strips to turn them into diodes, which are then reverse biased. As charged particles pass through ...
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