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Transistor testers have the necessary controls and switches for making the proper voltage, current and signal settings. A meter with a calibrated "good" and "bad" scale is on the front. In addition, these transistor testers are designed to check the solid-state diodes. There are also testers for checking high transistor and rectifiers.
Analog multimeter Digital multimeter. A multimeter (also known as a volt-ohm-milliammeter, volt-ohmmeter or VOM) [1] is a measuring instrument that can measure multiple electrical properties. [2] [3] A typical multimeter can measure voltage, resistance, and current, [4] in which case can be used as a voltmeter, ohmmeter, and ammeter.
Creates constant-amplitude variable frequency sine waves to test frequency response Transistor tester: Tests transistors Tube tester: Tests vacuum tubes (triode, tetrode etc.) Wattmeter: Measures power in a circuit Vectorscope: Displays the phase of the colors in color TV Video signal generator: Generates video signal for testing purposes Voltmeter
Measuring ESR can be done by applying an alternating voltage at a frequency at which the capacitor's reactance is negligible, in a voltage divider configuration. It is easy to check ESR well enough for troubleshooting by using an improvised ESR meter comprising a simple square-wave generator and oscilloscope, or a sinewave generator of a few tens of kilohertz and an AC voltmeter, using a known ...
A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components, such as diodes, transistors, thyristors, and vacuum tubes. The device contains voltage and current sources that can be used to stimulate the device under test (DUT).
In electrical engineering, an electrical isolation test is a direct current (DC) or alternating current (AC) resistance test that is performed on sub-systems of an electronic system to verify that a specified level of isolation resistance is met. Isolation testing may also be conducted between one or more electrical circuits of the same ...
Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.
The three electrode systems such as transistors require more complicated methods for the contact resistance approximation. The most common approach is the transmission line model (TLM). Here, the total device resistance R tot {\displaystyle R_{\text{tot}}} is plotted as a function of the channel length: