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  2. Fault detection and isolation - Wikipedia

    en.wikipedia.org/wiki/Fault_detection_and_isolation

    Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...

  3. Failure detector - Wikipedia

    en.wikipedia.org/wiki/Failure_detector

    The construction of a failure detector is an essential, but a very difficult problem that occurred in the development of the fault-tolerant component in a distributed computer system. As a result, the failure detector was invented because of the need for detecting errors in the massive information transaction in distributed computing systems.

  4. Fault management - Wikipedia

    en.wikipedia.org/wiki/Fault_management

    Ideally, a fault management system should be able to correctly identify events and automatically take action, either launching a program or script to take corrective action, or activating notification software that allows a human to take proper intervention (i.e. send e-mail or SMS text to a mobile phone). Some notification systems also have ...

  5. No fault found - Wikipedia

    en.wikipedia.org/wiki/No_fault_found

    No fault found (NFF), no trouble found (NTF) or no defect found (NDF) are terms used in the field of maintenance, where a unit is removed from service following a complaint of a perceived fault by operators or an alarm from its BIT (built-in test) equipment. The unit is then checked, but no anomaly is detected by the maintainer.

  6. Soft error - Wikipedia

    en.wikipedia.org/wiki/Soft_error

    Soft errors in logic circuits are sometimes detected and corrected using the techniques of fault tolerant design. These often include the use of redundant circuitry or computation of data, and typically come at the cost of circuit area, decreased performance, and/or higher power consumption.

  7. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  8. Fault reporting - Wikipedia

    en.wikipedia.org/wiki/Fault_reporting

    The historical approach for Fault discovery is periodic diagnostic testing, which eliminates the following operational availability penalty. A v a i l a b i l i t y R e d u c t i o n = T o t a l T i m e T o t a l T i m e + M a i n t e n a n c e D o w n T i m e {\displaystyle Availability\ Reduction={\frac {Total\ Time}{Total\ Time+Maintenance ...

  9. Formal methods - Wikipedia

    en.wikipedia.org/wiki/Formal_methods

    In computer science, formal methods are mathematically rigorous techniques for the specification, development, analysis, and verification of software and hardware systems. [1] The use of formal methods for software and hardware design is motivated by the expectation that, as in other engineering disciplines, performing appropriate mathematical ...

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