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In an electric power system, a fault or fault current is any abnormal electric current. For example, a short circuit is a fault in which a live wire touches a neutral or ground wire. An open-circuit fault occurs if a circuit is interrupted by a failure of a current-carrying wire (phase or neutral) or a blown fuse or circuit breaker.
A transient fault is a loss of power typically caused by a fault on a power line, e.g. a short circuit or flashover. Power is automatically restored once the fault is cleared. A brownout is a drop in voltage in an electrical power supply. The term brownout comes from the dimming experienced by incandescent lighting when the voltage sags.
This is a list of notable wide-scale power outages. To be included, the power outage must conform to all of the following criteria: The outage must not be planned by the service provider. The outage must affect at least 1,000 people. The outage must last at least one hour. There must be at least 1,000,000 person-hours of disruption. For example:
Power system protection is a branch of electrical power engineering that deals with the protection of electrical power systems from faults [citation needed] through the disconnection of faulted parts from the rest of the electrical network. The objective of a protection scheme is to keep the power system stable by isolating only the components ...
The device numbers are enumerated in ANSI/IEEE Standard C37.2 Standard for Electrical Power System Device Function Numbers, Acronyms, and Contact Designations. Many of these devices protect electrical systems and individual system components from damage when an unwanted event occurs such as an electrical fault.
The conventionally used aid in cable fault testing and location is the cable test van. The van is installed with conventional cable measuring systems for quickly reaching the location of any cable fault. In 20 years that followed, over 2000 fault location vehicles were manufactured, more than half of which were intended for the former USSR.
As their resistivity drops with increasing temperature, degradation of the maximum operating frequency of the chip the other way is an indicator of such a fault. Mousebites are regions where metallization has a decreased width; such defects usually do not show during electrical testing but present a major reliability risk. Increased current ...
Metal diffusion: Caused by high electrical currents or voltages at elevated temperatures, metal diffusion can move metal atoms from the electrodes into the active region. Some materials, notably indium tin oxide and silver , are subject to electromigration which causes leakage current and non-radiative recombination along the chip edges.