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2. Köhler illumination - Wikipedia

   en.wikipedia.org/wiki/Köhler_illumination

   Köhler illumination is a method of specimen illumination used for transmitted and reflected light (trans- and epi-illuminated) optical microscopy.Köhler illumination acts to generate an even illumination of the sample and ensures that an image of the illumination source (for example a halogen lamp filament) is not visible in the resulting image.

3. Structured illumination light sheet microscopy - Wikipedia

   en.wikipedia.org/wiki/Structured_Illumination...

   Moiré Effect. Structured illumination microscopy (SIM) is a method of super-resolution microscopy which is performed by acquiring multiple images of the same sample under different patterns of illumination, then computationally combining these images to achieve a single reconstruction with up to 2x improvement over the diffraction limited lateral resolution.

4. Ultramicroscope - Wikipedia

   en.wikipedia.org/wiki/Ultramicroscope

   An ultramicroscope is a microscope with a system that lights the object in a way that allows viewing of tiny particles via light scattering, and not light reflection or absorption. When the diameter of a particle is below or near the wavelength of visible light (around 500 nanometers ), the particle cannot be seen in a light microscope with the ...

5. Bright-field microscopy - Wikipedia

   en.wikipedia.org/wiki/Bright-field_microscopy

   A bright-field microscope has many important parts including; the condenser, the objective lens, the ocular lens, the diaphragm, and the aperture. Some other pieces of the microscope that are commonly known are the arm, the head, the illuminator, the base, the stage, the adjusters, and the brightness adjuster.

6. Scanning transmission electron microscopy - Wikipedia

   en.wikipedia.org/wiki/Scanning_transmission...

   A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...

7. Low-energy electron microscopy - Wikipedia

   en.wikipedia.org/wiki/Low-energy_electron_microscopy

   A low-energy electron microscope used for surface science studies at University of Illinois' Frederick Seitz Materials Research Laboratory in Urbana, IL, USA. Low-energy electron microscopy, or LEEM, is an analytical surface science technique used to image atomically clean surfaces, atom-surface interactions, and thin (crystalline) films. [1]