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An atomic force microscope on the left with controlling computer on the right. Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a ...
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
Photoconductive atomic force microscopy ... Φ is the barrier height. ... laser provides photocurrent images with vertical resolutions in the range of 0 to 10 pA when ...
AFM-IR compositional mapping of Streptomyces bacteria. Left: AFM topographic image of bacterial cells. Middle: AFM-IR absorption at 1650 cm −1, corresponding to the amide I band associated with protein. Right: AFM-IR absorption at the carbonyl band 1740 cm −1, indicating the distribution of triglyceride vesicles within bacterial cells.
This W3C-unspecified vector image was created with Inkscape. ... height. 425 pixel. width. 567 pixel. ... Schematic of an atomic force microscope
Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...
Gwyddion is a multiplatform modular free software for visualization and analysis of data from scanning probe microscopy (SPM) techniques (like AFM, MFM, STM, SNOM/NSOM). [1] The project is led by its main developers David Nečas (Yeti) and Petr Klapetek who work together with several various developers across the world.
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.