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Gwyddion is a multiplatform modular free software for visualization and analysis of data from scanning probe microscopy (SPM) techniques (like AFM, MFM, STM, SNOM/NSOM). [1] The project is led by its main developers David Nečas (Yeti) and Petr Klapetek who work together with several various developers across the world.
An atomic force microscope on the left with controlling computer on the right. Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a ...
Version 8.0 (June 2019) is the successor of both Mountains 7.4 and SPIP 6.7 software packages ("SPIP" standing for "Scanning Probe Image Processor") after the acquisition by Digital Surf of the Danish company Image Metrology A/S, the editor of SPIP. [25] Version 8.0 also introduces the analysis of free form surfaces, called "Shells" in the ...
CellProfiler, a software package for high-throughput image analysis by interactive construction of workflow. The workflow could include ImageJ macro The workflow could include ImageJ macro CVIPtools A complete open-source GUI-based Computer Vision and Image Processing software, with C functions libraries COM based dll along with two utilities ...
An image of the indent can also be measured using software. The atomic force microscope (AFM) scans the indent. First the lowest point of the indentation is found. Make an array of lines around the using linear lines from indent center along the indent surface.
This software enables users of atomic force microscopes to easily: build complex band-excitation waveforms, set up the microscope scanning conditions, configure the input and output electronics to generate the waveform as a voltage signal and capture the response of the system, perform analysis on the captured response, and display the results ...
AFM-IR combines the chemical analysis power of infrared spectroscopy and the high-spatial resolution of scanning probe microscopy (SPM). The term was first used to denote a method that combined a tuneable free electron laser with an atomic force microscope (AFM, a type of SPM) equipped with a sharp probe that measured the local absorption of ...
Electrochemical AFM (EC-AFM) is a particular type of Scanning probe microscopy (SPM), which combines the classical Atomic force microscopy (AFM) together with electrochemical measurements. EC-AFM allows to perform in-situ AFM measurements in an electrochemical cell , in order to investigate the actual changes in the electrode surface morphology ...