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Elenco LP-560 logic probe. It has a red LED for high state, green LED for low state, amber LED for pulsing state, and a changing audible tone. [1] A logic probe is a low-cost hand-held test probe used for analyzing and troubleshooting the logical states (boolean 0 or 1) of a digital circuit.
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
An ATE can be a simple computer-controlled digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits.
A test probe is a physical device used to connect electronic test equipment to a device under test (DUT). Test probes range from very simple, robust devices to complex probes that are sophisticated, expensive, and fragile. Specific types include test prods, oscilloscope probes and current probes. A test probe is often supplied as a test lead ...
Logic analyzer. A logic analyzer is an electronic instrument that captures and displays multiple logic signals from a digital system or digital circuit. A logic analyzer may convert the captured data into timing diagrams, protocol decodes, state machine traces, opcodes, or may correlate opcodes with source-level software. Logic analyzers have ...
Diode logic (or diode-resistor logic) constructs AND and OR logic gates with diodes and resistors. An active device ( vacuum tubes with control grids in early electronic computers , then transistors in diode–transistor logic ) is additionally required to provide logical inversion (NOT) for functional completeness and amplification for voltage ...
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The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.
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