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X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
The use of computational methods for the powder X-ray diffraction data analysis is now generalized. It typically compares the experimental data to the simulated diffractogram of a model structure, taking into account the instrumental parameters, and refines the structural or microstructural parameters of the model using least squares based ...
The most common powder X-ray diffraction (XRD) refinement technique used today is based on the method proposed in the 1960s by Hugo Rietveld. [2] The Rietveld method fits a calculated profile (including all structural and instrumental parameters) to experimental data.
It also publishes the journals Advances in X-ray Analysis and Powder Diffraction. In 2019, Materials Data, also known as MDI, merged with ICDD. Materials Data creates JADE software used to collect, analyze, and simulate XRD data and solve issues in an array of materials science projects.
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [1] using a laboratory diffractometer and a monochromatic X-ray pencil beam.
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...
Typically, powder X-ray diffraction (XRD) is an average of randomly oriented microcrystals that should equally represent all crystal orientation if a large enough sample is present. X-rays are directed at the sample while slowly rotated that produce a diffraction pattern that shows intensity of x-rays collected at different angles. Randomly ...
X-ray crystal truncation rod scattering is a powerful method in surface science, based on analysis of surface X-ray diffraction (SXRD) patterns from a crystalline surface. For an infinite crystal , the diffracted pattern is concentrated in Dirac delta function like Bragg peaks .
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