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Image of pollen grains taken on a SEM shows the characteristic depth of field of SEM micrographs M. von Ardenne's first SEM SEM with opened sample chamber Analog type SEM. A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.
The resulting image is larger than the original, and preserves all the original detail, but has (possibly undesirable) jaggedness. The diagonal lines of the "W", for example, now show the "stairway" shape characteristic of nearest-neighbor interpolation. Other scaling methods below are better at preserving smooth contours in the image.
The nanofocusing technique can create a nanometer-scale "white" light source at the tip apex, which can be used to illuminate a sample at near-field for spectroscopic analysis. The interband optical transitions in individual single-walled carbon nanotubes are imaged and a spatial resolution around 6 nm has been reported.
As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so ...
The exit wave now passes through the imaging system of the microscope where it undergoes further phase change and interferes as the image wave in the imaging plane (mostly a digital pixel detector like a CCD camera). The recorded image is not a direct representation of the samples crystallographic structure. For instance, high intensity might ...
Image scaling can be interpreted as a form of image resampling or image reconstruction from the view of the Nyquist sampling theorem. According to the theorem, downsampling to a smaller image from a higher-resolution original can only be carried out after applying a suitable 2D anti-aliasing filter to prevent aliasing artifacts. The image is ...
The microscope features a combination of optical and electron-optical images; the optical image enables a "Neverlost" function so operators may navigate to any point on the sample. Sample loading takes place in four seconds (to obtain the CMOS overview image) and 30 seconds into the vacuum space via rapid transfer technology (no conventional ...
Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera .