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The open-circuit test, or no-load test, is one of the methods used in electrical engineering to determine the no-load impedance in the excitation branch of a transformer. The no load is represented by the open circuit, which is represented on the right side of the figure as the "hole" or incomplete part of the circuit.
A different form of short-circuit testing is done to assess the mechanical strength of the transformer windings, and their ability to withstand the high forces produced if an energized transformer experiences a short-circuit fault. Currents during such events can be several times the normal rated current.
The voltage v oc between the terminals is the open-circuit voltage of the device. Black curve: The highest possible open-circuit voltage of a solar cell in the Shockley-Queisser model under unconcentrated sunlight, as a function of the semiconductor bandgap. The red dotted line shows that this voltage is always smaller than the bandgap voltage.
It is also known as short-circuit test (because it is the mechanical analogy of a transformer short-circuit test), [1] locked rotor test or stalled torque test. [2] From this test, short-circuit current at normal voltage, power factor on short circuit, total leakage reactance, and starting torque of the motor can be found.
The open-circuit saturation curve (also open-circuit characteristic, OCC) of a synchronous generator is a plot of the output open circuit voltage as a function of the excitation current or field. The curve is typically plotted alongside the synchronous impedance curve .
An even simpler model of the diode, sometimes used in switching applications, is short circuit for forward voltages and open circuit for reverse voltages. The model of a forward biased pn junction having an approximately constant 0.7V is also a much used approximation for transistor base-emitter junction voltage in amplifier design.
The surge is defined by the Combination Wave Generator's open-circuit voltage and short-circuit current waveforms, characterized by front time, duration, and peak values. With an open circuit output, the surge voltage is a double exponential pulse in the form of k ( e − α t − e − β t ) {\displaystyle k(e^{-\alpha t}-e^{-\beta t})} .
In this case, Z d is the same as the impedance of the input test current source signal made zero or equivalently with the input open circuited. Likewise, since the transfer function output signal can be considered to be the voltage at the input terminals, Z n is found when the input voltage is zero i.e. the input terminals are short-circuited.