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Creates constant-amplitude variable frequency sine waves to test frequency response Transistor tester: Tests transistors Tube tester: Tests vacuum tubes (triode, tetrode etc.) Wattmeter: Measures power in a circuit Vectorscope: Displays the phase of the colors in color TV Video signal generator: Generates video signal for testing purposes Voltmeter
Transistor testers have the necessary controls and switches for making the proper voltage, current and signal settings. A meter with a calibrated "good" and "bad" scale is on the front. In addition, these transistor testers are designed to check the solid-state diodes. There are also testers for checking high transistor and rectifiers.
A spectrum analyser – typically used as the measuring instrument in two-tone testing. Two-tone testing is a means of testing electronic components and systems, particularly radio systems, for intermodulation distortion. It consists of simultaneously injecting two sinusoidal signals of different frequencies (tones) into the component or system.
In electronics, a continuity test is the checking of an electric circuit to see if current flows (that it is in fact a complete circuit). A continuity test is performed by placing a small voltage (wired in series with an LED or noise-producing component such as a piezoelectric speaker ) across the chosen path.
The Type 575 Transistor-Curve Tracer displays the dynamic characteristic curves of both NPN and PNP transistors on the screen of a 5-inch cathode-ray tube. Several different transistor characteristic curves may be displayed, including the collector family in the common-base and common emitter configuration. In addition to the transistor ...
In electrical engineering, an electrical isolation test is a direct current (DC) or alternating current (AC) resistance test that is performed on sub-systems of an electronic system to verify that a specified level of isolation resistance is met. Isolation testing may also be conducted between one or more electrical circuits of the same ...
Wafer testing is a step performed during semiconductor device fabrication after back end of line (BEOL) and before IC packaging.. Two types of testing are typically done. Very basic wafer parametric tests (WPT) are performed at a few locations on each wafer to ensure the wafer fabrication process has been carried out successfully.
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