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Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
Near field infrared spectrometry and near-field dielectric microscopy [19] use near-field probes to combine sub-micron microscopy with localized IR spectroscopy. [ 25 ] The nano-FTIR [ 26 ] method is a broadband nanoscale spectroscopy that combines apertureless NSOM with broadband illumination and FTIR detection to obtain a complete infrared ...
Since then a few groups have reported Raman or fluorescence enhancement in near field optical spectroscopy by apertureless microscopy. [8] In 2000, T. Kalkbrenner et al. used a single gold particle as a probe for apertureless scanning and presented images of an aluminium film with 3 μm holes on a glass substrate. [9]
In principle, this opens the way to sub-wavelength IR microscopy (see scanning probe microscopy) where the image contrast is to be determined by the thermal response of individual sample regions to particular spectral wavelengths and 2) in general, no special preparation technique is required when solid samples are to be studied. For most ...
Tip-enhanced Raman spectroscopy (TERS) is a variant of surface-enhanced Raman spectroscopy (SERS) [1] that combines scanning probe microscopy with Raman spectroscopy. High spatial resolution chemical imaging is possible via TERS, [2] with routine demonstrations of nanometer spatial resolution under ambient laboratory conditions, [3] or better [4] at ultralow temperatures and high pressure.
Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.
Scanning ion-conductance microscopy diagram. Scanning ion-conductance microscopy (SICM) is a scanning probe microscopy technique that uses an electrode as the probe tip. [1] SICM allows for the determination of the surface topography of micrometer and even nanometer-range [2] structures in aqueous media conducting electrolytes. The samples can ...