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  2. Probe tip - Wikipedia

    en.wikipedia.org/wiki/Probe_Tip

    A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures. The probe tip is mounted on the end of a cantilever and can be as sharp as a single atom .

  3. Nanoprobing - Wikipedia

    en.wikipedia.org/wiki/Nanoprobing

    Existing nanoprobe needles or “probe tips” have a typical end-point radius ranging from 5 to 35 nm. [2] The fine tips enable access to individual contacts nodes of modern IC transistors. Navigation of the probe tips in SEM based nanoprobers are typically controlled by precision piezoelectric manipulators. Typical systems have anywhere from ...

  4. Current clamp - Wikipedia

    en.wikipedia.org/wiki/Current_clamp

    In electrical and electronic engineering, a current clamp, also known as current probe, is an electrical device with jaws which open to allow clamping around an electrical conductor. This allows measurement of the current in a conductor without the need to make physical contact with it, or to disconnect it for insertion through the probe.

  5. Test probe - Wikipedia

    en.wikipedia.org/wiki/Test_probe

    The matched impedances provide better high-frequency performance than an unmatched passive probe can achieve, but at the expense of the low 500-ohm load offered by the probe tip to the DUT. Parasitic capacitance at the probe tip is very low so, for very high-frequency signals, the Z 0 probe can offer lower loading than any hi-Z probe and even ...

  6. Hose coupling - Wikipedia

    en.wikipedia.org/wiki/Hose_coupling

    Hose link is a 1/4-turn bayonet-mount garden hose connection, which uses an o-ring to o-ring seal. It was designed by Hoselink, Pty, Ltd., Australia, [24] and patented in 1998. [25] It is popular in Australia, with limited distribution in the UK and the US, where it is distributed by Dayco Products, Inc.

  7. Mercury probe - Wikipedia

    en.wikipedia.org/wiki/Mercury_probe

    The mercury probe is an electrical probing device to make rapid, non-destructive contact to a sample for electrical characterization. Its primary application is semiconductor measurements where otherwise time-consuming metallizations or photolithographic processing are required to make contact to a sample.

  8. Langmuir probe - Wikipedia

    en.wikipedia.org/wiki/Langmuir_probe

    The probe is the spherical part, 50 mm in diameter and made from titanium with a surface coating of titanium nitride. A Langmuir probe is a device used to determine the electron temperature, electron density, and electric potential of a plasma. It works by inserting one or more electrodes into a plasma, with a constant or time-varying electric ...

  9. Flashback arrestor - Wikipedia

    en.wikipedia.org/wiki/Flashback_arrestor

    Flashbacks which are the rapid propagation of a flame down the hose. Further gas flow in the event of a burnback. According to the standard DIN EN ISO 5175-1 (formerly EN 730-1) they include a minimum of two safety elements: A gas non-return valve (NV), which: prevents dangerous gas mixtures. ensures the gas only flows in the intended direction.

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