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Phase-contrast microscopy (PCM) is an optical microscopy technique that converts phase shifts in light passing through a transparent specimen to brightness changes in the image. Phase shifts themselves are invisible, but become visible when shown as brightness variations.
In the field of transmission electron microscopy, phase-contrast imaging may be employed to image columns of individual atoms; a more common name is high-resolution transmission electron microscopy. It is the highest resolution imaging technique ever developed, and can allow for resolutions of less than one angstrom (less than 0.1 nanometres).
Quantitative phase contrast microscopy or quantitative phase imaging are the collective names for a group of microscopy methods that quantify the phase shift that occurs when light waves pass through a more optically dense object. [1] [2] Translucent objects, like a living human cell, absorb and scatter small amounts of light.
X-ray absorption (left) and differential phase-contrast (right) image of an in-ear headphone obtained with a grating interferometer at 60kVp. Phase-contrast X-ray imaging or phase-sensitive X-ray imaging is a general term for different technical methods that use information concerning changes in the phase of an X-ray beam that passes through an object in order to create its images.
Dark-field microscopy produces an image with a dark background Operating principles of dark-field and phase-contrast microscopies Dark-field microscopy is a very simple yet effective technique and well suited for uses involving live and unstained biological samples, such as a smear from a tissue culture or individual, water-borne, single-celled ...
TEM Ray Diagram with Phase Contrast Transfer Function. Contrast transfer theory provides a quantitative method to translate the exit wavefunction to a final image. Part of the analysis is based on Fourier transforms of the electron beam wavefunction. When an electron wavefunction passes through a lens, the wavefunction goes through a Fourier ...
[20] [21] Quantitative phase-contrast microscopy has an advantage over fluorescent and phase-contrast microscopy in that it is both non-invasive and quantitative in its nature. Due to the narrow focal depth of conventional microscopy, live-cell imaging is to a large extent currently limited to observing cells on a single plane.
The differential phase contrast imaging technique (DPC) can be used in STEM to characterise magnetic and electric fields inside a thin specimen. The electric or magnetic field in samples is estimated by measuring the deflection of the electron beam caused by the field at each scan point.
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