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  2. Epstein frame - Wikipedia

    en.wikipedia.org/wiki/Epstein_frame

    The sample under test should be prepared as a set of a number of strips (always a multiple of four) cut from electrical steel sheet or ribbon. Each layer of the sample is double-lapped in corners and weighted down with a force of 1 N [ clarification needed ] (see photo).

  3. DIN 72552 - Wikipedia

    en.wikipedia.org/wiki/DIN_72552

    1, 2 53i wiper motor with permanent magnet, third brush for high speed Acoustic warning 71 beeper in H 71a beeper out, low 71b beeper out, high 72 hazard lights switch 85c hazard sound on Switches 81 opener 81a 1 out 81b 2 out 82 lock in 82a 1st out 82b 2nd out 82z 1st in 82y 2nd in 83 multi position switch, in 83a out position 1 83b out position 2

  4. Electrical outlet tester - Wikipedia

    en.wikipedia.org/wiki/Electrical_outlet_tester

    A receptacle tester being used to check for some types of improper wiring of an outlet. For this particular tester, proper wiring is indicated by the two yellow lights. The outlet tester checks that each contact in the outlet appears to be connected to the correct wire in the building's electrical wiring. It can identify several common wiring ...

  5. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE . Its purpose is to provide ...

  6. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.

  7. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    The instruments may include device power supplies (DPS), [1] [2] parametric measurement units (PMU), arbitrary waveform generators (AWG), digitizers, digital IOs, and utility supplies. The instruments perform different measurements on the DUT, and the instruments are synchronized so that they source and measure waveforms at the proper times.

  8. Test light - Wikipedia

    en.wikipedia.org/wiki/Test_light

    A test light, test lamp, voltage tester, or mains tester is a piece of electronic test equipment used to determine the presence of electricity in a piece of equipment under test. A test light is simpler and less costly than a measuring instrument such as a multimeter , and often suffices for checking for the presence of voltage on a conductor.

  9. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    In 1975, the IEEE published ANSI/IEEE Standard 488–1975, IEEE Standard Digital Interface for Programmable Instrumentation, which contained the electrical, mechanical, and functional specifications of an interfacing system. This standard was subsequently revised in 1978 (IEEE-488.1) and 1990 (IEEE-488.2).

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