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  2. Atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Atomic_force_microscopy

    An atomic force microscope on the left with controlling computer on the right. Atomic force microscopy [1] (AFM) is a type of SPM, with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The information is gathered by "feeling" or "touching" the surface with a ...

  3. Non-contact atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Non-contact_atomic_force...

    Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...

  4. 1.3 Gallery: DNA molecular modeling applications 1.4 Gallery of AFM images 1.5 Gallery: CARS (Raman spectroscopy), fluorescence confocal microscopy, and hyperspectral imaging

  5. Conductive atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Conductive_atomic_force...

    Topographic (left) and current (right) maps collected with CAFM on a polycrystalline HfO 2 stack. The images show very good spatial correlation. In microscopy, conductive atomic force microscopy (C-AFM) or current sensing atomic force microscopy (CS-AFM) is a mode in atomic force microscopy (AFM) that simultaneously measures the topography of a material and the electric current flow at the ...

  6. Piezoresponse force microscopy - Wikipedia

    en.wikipedia.org/wiki/Piezoresponse_force_microscopy

    From left to right shows images of increasing magnification where the scale bar in the first image is 50 μm and in the third is 200 nm. The first image shows the substrate, cantilever and the tip whereas the second image shows the tip geometry whilst the last image shows the tip apex and demonstrates the fine point that is achieved e.g. radius ...

  7. Photoconductive atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Photoconductive_Atomic...

    The instrumentation involved for pc-AFM is very similar to that necessary for traditional AFM or the modified conductive AFM. The main difference between pc-AFM and other types of AFM instruments is the illumination source that is focused through the inverted microscope objective and the neutral density filter that is positioned adjacent to the illumination source.

  8. Mysterious Kanye West Doc ‘In Whose Name?’ Heads to AFM With ...

    www.aol.com/entertainment/mysterious-kanye-west...

    A mystery-shrouded documentary about Kanye West has surfaced, with Variety able to reveal details for the very first time alongside its title and a first-look image.

  9. Wikipedia:Featured picture candidates/Atomic-resolution image ...

    en.wikipedia.org/wiki/Wikipedia:Featured_picture...

    Image of surface reconstruction on a clean Au() surface, as visualized using scanning tunneling microscopy.The individual atoms composing the material are visible. Surface reconstruction causes the surface atoms to deviate from the bulk crystal structure, and arrange in columns several atoms wide with regularly-spaced pits between them.