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  2. Logic built-in self-test - Wikipedia

    en.wikipedia.org/wiki/Logic_built-in_self-test

    The main advantage of LBIST is the ability to test internal circuits having no direct connections to external pins, and thus unreachable by external automated test equipment. Another advantage is the ability to trigger the LBIST of an integrated circuit while running a built-in self test or power-on self test of the finished product.

  3. Test light - Wikipedia

    en.wikipedia.org/wiki/Test_light

    A test light, test lamp, voltage tester, or mains tester is a piece of electronic test equipment used to determine the presence of electricity in a piece of equipment under test. A test light is simpler and less costly than a measuring instrument such as a multimeter , and often suffices for checking for the presence of voltage on a conductor.

  4. Built-in self-test - Wikipedia

    en.wikipedia.org/wiki/Built-in_self-test

    Programmable built-in self-test (pBIST) Memory built-in self-test (mBIST) - e.g. with the Marinescu algorithm [2] Logic built-in self-test (LBIST) Analog and mixed-signal built-in self-test (AMBIST) Continuous built-in self-test (CBIST, C-BIT) Event-driven built-in self-test, such as the BIST done to an aircraft's systems after the aircraft lands.

  5. Continuity tester - Wikipedia

    en.wikipedia.org/wiki/Continuity_tester

    Entry-level cable testers are essentially continuity testers. A continuity tester is an item of electrical test equipment used to determine if an electrical path can be established between two points; [1] that is if an electrical circuit can be made. The circuit under test is completely de-energized prior to connecting the apparatus. [1]

  6. Logic probe - Wikipedia

    en.wikipedia.org/wiki/Logic_probe

    While most logic probes are powered by the circuit under test, some devices use batteries. They can be used on either TTL (transistor-transistor logic) or CMOS (complementary metal-oxide semiconductor) logic integrated circuit devices, such as 7400-series, 4000 series, and newer logic families that support similar voltages.

  7. Device under test - Wikipedia

    en.wikipedia.org/wiki/Device_under_test

    In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test equipment. The test equipment then applies power to the part, supplies stimulus signals, then measures and evaluates the resulting outputs from the device.

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