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X-ray diffraction. X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called ...
X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions. By measuring the angles and intensities of the X-ray diffraction, a crystallographer can produce a three-dimensional picture of ...
XRD may refer to: X-ray diffraction, used to study the structure, composition, and physical properties of materials. Extensible Resource Descriptor, an XML format for discovery of metadata about a web resource. Guilty Gear Xrd, a fighting video game.
Bragg's law. Physical law regarding scattering angles of radiation through a medium. In many areas of science, Bragg's law, Wulff –Bragg's condition, or Laue–Bragg interference are a special case of Laue diffraction, giving the angles for coherent scattering of waves from a large crystal lattice. It describes how the superposition of wave ...
Powder diffraction is a scientific technique using X-ray, neutron, or electron diffraction on powder or microcrystalline samples for structural characterization of materials. [2] An instrument dedicated to performing such powder measurements is called a powder diffractometer. Powder diffraction stands in contrast to single crystal diffraction ...
X-ray diffraction units were widely used in academic research departments to do crystal analysis. An essential component of a diffraction unit was a very accurate angle measuring device known as a goniometer .
Scherrer equation. The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub- micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.
Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions. The height, width and position of these reflections can be used to determine many ...
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