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Variety of loose pogo pins and pogo pins in 3-pin assembly holders and with Pick and Place caps Sectional drawing of a pogo pin, showing the plunger, barrel, and spring. A pogo pin or spring-loaded pin is a type of electrical connector mechanism with spring plungers that is used in many modern electronic applications and in the electronics testing industry. [1]
Spring probes (a.k.a. "pogo pins") are spring-loaded pins used in electrical test fixtures to contact test points, component leads, and other conductive features of the DUT (Device Under Test). These probes are usually press-fit into probe sockets, to allow their easy replacement on test fixtures which may remain in service for decades, testing ...
Spring loaded pins are a component of the bed of nails tester. A bed of nails tester is a traditional electronic test fixture used for in-circuit testing.It has pins inserted into holes in an epoxy phenolic glass cloth laminated sheet (G-10) which are aligned using tooling pins to make contact with test points on a printed circuit board and are also connected to a measuring unit by wires.
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.
C.C.P. Contact Probes Co., Ltd. (Chinese: 中國探針股份有限公司; pinyin: Zhōng Guó Tàn Zhēn Yǒu Xiàn Gōng Sī) is a Taiwanese manufacturer of testing probes and probe-like connectors. [4] The company was founded by Chung-Kai Huang (黃介崇) on January 22, 1986 and is headquartered in New Taipei, Taiwan.
One limitation in flying probe test methods is the speed at which measurements can be taken; the probes must be moved to each new test site on the board, and then a measurement must be completed. Bed-of-nails testers touch each test point simultaneously and electronic switching of instruments between test pins is more rapid than movement of probes.
Pogo pin connectors. Pogo pin or spring loaded connectors are commonly used in consumer and industrial products, where mechanical resilience and ease of use are priorities. [32] The connector consists of a barrel, a spring, and a plunger. They are in applications such as the MagSafe connector where a quick disconnect is desired for safety.
Side view of a PCB showing a solder bead and test probe. Bead probe technology is a probing method used to connect electronic test equipment to the device under test (DUT) within a bed of nails fixture. The technique was first used in the 1990s [3] and originally given the name “Waygood Bump” after one of the main proponents, Rex Waygood.