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Variety of loose pogo pins and pogo pins in 3-pin assembly holders and with Pick and Place caps Sectional drawing of a pogo pin, showing the plunger, barrel, and spring. A pogo pin or spring-loaded pin is a type of electrical connector mechanism with spring plungers that is used in many modern electronic applications and in the electronics testing industry. [1]
C.C.P Contact Probes., Ltd. operates internationally with global sales offices in China, Hong Kong, USA [5] and Germany and has approximately 1000 [6] employees. The 4 main products are testing solutions , Pogo Pin Connectors , EV Crown Spring Connectors [ 7 ] [ 8 ] and Industrial Connectors.
One limitation in flying probe test methods is the speed at which measurements can be taken; the probes must be moved to each new test site on the board, and then a measurement must be completed. Bed-of-nails testers touch each test point simultaneously and electronic switching of instruments between test pins is more rapid than movement of probes.
Spring loaded pins are a component of the bed of nails tester. A bed of nails tester is a traditional electronic test fixture used for in-circuit testing.It has pins inserted into holes in an epoxy phenolic glass cloth laminated sheet (G-10) which are aligned using tooling pins to make contact with test points on a printed circuit board and are also connected to a measuring unit by wires.
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.
The company devised a method for applying strain gage testing to determining the stresses placed on circuit boards by the hundreds or thousands of test probes used to make electrical contact therewith. [3] [4] This is useful because each test probe (a.k.a. "pogo pin") exerts several ounces of
Spring probes (a.k.a. "pogo pins") are spring-loaded pins used in electrical test fixtures to contact test points, component leads, and other conductive features of the DUT (Device Under Test). These probes are usually press-fit into probe sockets, to allow their easy replacement on test fixtures which may remain in service for decades, testing ...
MEMS type is the most advanced technology currently available. The most advanced type of probe card currently can test an entire 12" wafer with one touchdown. Probe cards or DUT boards are designed to meet both the mechanical and electrical requirements of the particular chip and the specific test equipment to be used.