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Variety of loose pogo pins and pogo pins in 3-pin assembly holders and with Pick and Place caps Sectional drawing of a pogo pin, showing the plunger, barrel, and spring. A pogo pin or spring-loaded pin is a type of electrical connector mechanism with spring plungers that is used in many modern electronic applications and in the electronics testing industry. [1]
Spring loaded pins are a component of the bed of nails tester. A bed of nails tester is a traditional electronic test fixture used for in-circuit testing.It has pins inserted into holes in an epoxy phenolic glass cloth laminated sheet (G-10) which are aligned using tooling pins to make contact with test points on a printed circuit board and are also connected to a measuring unit by wires.
Spring probes (a.k.a. "pogo pins") are spring-loaded pins used in electrical test fixtures to contact test points, component leads, and other conductive features of the DUT (Device Under Test). These probes are usually press-fit into probe sockets, to allow their easy replacement on test fixtures which may remain in service for decades, testing ...
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.
C.C.P Contact Probes., Ltd. operates internationally with global sales offices in China, Hong Kong, USA [5] and Germany and has approximately 1000 [6] employees. The 4 main products are testing solutions , Pogo Pin Connectors , EV Crown Spring Connectors [ 7 ] [ 8 ] and Industrial Connectors.
The company devised a method for applying strain gage testing to determining the stresses placed on circuit boards by the hundreds or thousands of test probes used to make electrical contact therewith. [3] [4] This is useful because each test probe (a.k.a. "pogo pin") exerts several ounces of
One limitation in flying probe test methods is the speed at which measurements can be taken; the probes must be moved to each new test site on the board, and then a measurement must be completed. Bed-of-nails testers touch each test point simultaneously and electronic switching of instruments between test pins is more rapid than movement of probes.
Bead probe technology is a probing method used to connect electronic test equipment to the device under test (DUT) within a bed of nails fixture. The technique was first used in the 1990s [ 3 ] and originally given the name “Waygood Bump” after one of the main proponents, Rex Waygood.
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