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  2. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    In addition to transmission methods, low-energy electron diffraction [32] is a technique where electrons are back-scattered off surfaces and has been extensively used to determine surface structures at the atomic scale, and reflection high-energy electron diffraction is another which is extensively used to monitor thin film growth. [33]

  3. Wide-angle X-ray scattering - Wikipedia

    en.wikipedia.org/wiki/Wide-angle_X-ray_scattering

    It is an X-ray-diffraction [2] method and commonly used to determine a range of information about crystalline materials. The term WAXS is commonly used in polymer sciences to differentiate it from SAXS but many scientists doing "WAXS" would describe the measurements as Bragg/X-ray/powder diffraction or crystallography .

  4. Industrial radiography - Wikipedia

    en.wikipedia.org/wiki/Industrial_radiography

    The two most common radionuclides used in industrial radiography are Iridium-192 and Cobalt-60. But others are used in general industry as well. [10] Am-241: Backscatter gauges, smoke detectors, fill height and ash content detectors. Sr-90: Thickness gauging for thick materials up to 3 mm.

  5. Illite crystallinity - Wikipedia

    en.wikipedia.org/wiki/Illite_crystallinity

    Results from the XRD are then compared to pre-established values assigned to metamorphic zones/metamorphic facies. The targets of the results are the peaks on the XRD plots. Width of the illite XRD peak at one half of its height is collected and recorded with units of ∆ °2θ (XRD angle). [1]

  6. XRD - Wikipedia

    en.wikipedia.org/wiki/XRD

    XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource

  7. Rietveld refinement - Wikipedia

    en.wikipedia.org/wiki/Rietveld_refinement

    The height, width and position of these reflections can be used to determine many aspects of the material's structure. The Rietveld method uses a least squares approach to refine a theoretical line profile until it matches the measured profile. The introduction of this technique was a significant step forward in the diffraction analysis of ...

  8. Powder diffraction - Wikipedia

    en.wikipedia.org/wiki/Powder_diffraction

    The result is that the crystallinity will never reach 100%. Powder XRD can be used to determine the crystallinity by comparing the integrated intensity of the background pattern to that of the sharp peaks. Values obtained from powder XRD are typically comparable but not quite identical to those obtained from other methods such as DSC.

  9. Meteorological instrumentation - Wikipedia

    en.wikipedia.org/wiki/Meteorological_instrumentation

    A pyranometer is a type of actinometer used to measure broadband solar irradiance on a planar surface and is a sensor that is designed to measure the solar radiation flux density (in watts per metre square) from a field of view of 180 degrees. A ceilometer is a device that uses a laser or other light source to determine the height of a cloud ...