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IEEE 200-1975 or "Standard Reference Designations for Electrical and Electronics Parts and Equipments" is a standard that was used to define referencing naming systems for collections of electronic equipment. IEEE 200 was ratified in 1975. The IEEE renewed the standard in the 1990s, but withdrew it from active support shortly thereafter.
A parts book, parts catalogue or illustrated part catalogue is a book published by a manufacturer which contains the illustrations, part numbers and other relevant data for their products or parts thereof. Parts books were often issued as microfiche, though this has fallen out of favour. Now, many manufacturers offer this information digitally ...
Here we show block diagrams for typical superheterodyne receivers for AM and FM broadcast respectively. This particular FM design uses a modern phase locked loop detector, unlike the frequency discriminator or ratio detector used in earlier FM receivers. A schematic of a simple superhet broadcast FM receiver.
TO-XX: wide range of small pin count packages often used for discrete parts like transistors or diodes. TO-3: Panel-mount with leads; TO-5: Metal can package with radial leads; TO-18: Metal can package with radial leads; TO-39; TO-46; TO-66: Similar shape to the TO-3 but smaller; TO-92: Plastic-encapsulated package with three leads
Electronic components have a wide range of failure modes. These can be classified in various ways, such as by time or cause. Failures can be caused by excess temperature, excess current or voltage, ionizing radiation, mechanical shock, stress or impact, and many other causes. In semiconductor devices, problems in the device package may cause ...
Newark markets and distributes electronic components and test equipment for engineers and maintenance professionals throughout the US, Canada and Mexico.Products include connectors, relays, switches, semiconductors, sensors, test equipment and tools from companies including Texas Instruments, 3M, Belden, Freescale and Honeywell, among others.
Time-dependent gate oxide breakdown (or time-dependent dielectric breakdown, TDDB) is a kind of transistor aging, a failure mechanism in MOSFETs, when the gate oxide breaks down as a result of long-time application of relatively low electric field (as opposed to immediate breakdown, which is caused by strong electric field).
Electronic components are mostly industrial products, available in a singular form and are not to be confused with electrical elements, which are conceptual abstractions representing idealized electronic components and elements. A datasheet for an electronic component is a technical document that provides detailed information about the ...