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  2. Power over Ethernet - Wikipedia

    en.wikipedia.org/wiki/Power_over_Ethernet

    The original PoE standard, IEEE 802.3af-2003, [1] now known as Type 1, provides up to 15.4 W of DC power (minimum 44 V DC and 350 mA) [2] [3] on each port. [4] Only 12.95 W is guaranteed to be available at the powered device as some power dissipates in the cable.

  3. List of free electronics circuit simulators - Wikipedia

    en.wikipedia.org/wiki/List_of_free_electronics...

    List of free analog and digital electronic circuit simulators, available for Windows, macOS, Linux, and comparing against UC Berkeley SPICE.The following table is split into two groups based on whether it has a graphical visual interface or not.

  4. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

  5. In-circuit testing - Wikipedia

    en.wikipedia.org/wiki/In-circuit_testing

    While in-circuit test is a very powerful tool for testing PCBs, it has these limitations: Parallel components can often only be tested as one component if the components are of the same type (i.e. two resistors); though different components in parallel may be testable using a sequence of different tests - e.g. a DC voltage measurement versus a measurement of AC injection current at a node.

  6. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.

  7. Boundary scan - Wikipedia

    en.wikipedia.org/wiki/Boundary_scan

    To provide the boundary scan capability, IC vendors add additional logic to each of their devices, including scan cells for each of the external traces. These cells are then connected together to form the external boundary scan shift register (BSR), and combined with JTAG Test Access Port (TAP) controller support comprising four (or sometimes more) additional pins plus control circuitry.

  8. Electronically controlled unit injector - Wikipedia

    en.wikipedia.org/wiki/Electronically_controlled...

    An electronically controlled unit injector (EUI) sometimes referred to as a mechanical electronic unit injector (MEUI) is a unit injector (UI) with electronic control. It performs the same function as a conventional unit injector in an internal combustion engine , such as in an on-road or off-road vehicle or a diesel-electric locomotive .

  9. Test fixture - Wikipedia

    en.wikipedia.org/wiki/Test_fixture

    In testing electronic equipment such as circuit boards, electronic components, and chips, a test fixture is a device or setup designed to hold the device under test in place and allow it to be tested by being subjected to controlled electronic test signals. [1]

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