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A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986.
Scanning tunneling spectroscopy is an experimental technique which uses a scanning tunneling microscope (STM) to probe the local density of electronic states (LDOS) and the band gap of surfaces and materials on surfaces at the atomic scale. [1]
Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.
The spin polarized scanning tunneling microscope is a versatile instrument which has gained tremendous attention due to its enhanced surface sensitivity and lateral resolution up to atomic scale, and can be used as an important tool to study ferromagnetic materials, such as dysprosium (Dy), quasi-2D thin films, nano islands and quasi-1D ...
The electrochemical scanning tunneling microscope (EC-STM) is a scanning tunneling microscope that measures the structures of surfaces and electrochemical reactions in solid-liquid interfaces at atomic or molecular scales.
Quantum microscopy allows microscopic properties of matter and quantum particles to be measured and imaged. Various types of microscopy use quantum principles. The first microscope to do so was the scanning tunneling microscope, which paved the way for development of the photoionization microscope and the quantum entanglement microscope.
Atomic manipulation is the process of moving single atoms on a substrate using Scanning Tunneling Microscope (STM). The atomic manipulation is a surface science technique usually used to create artificial objects on the substrate made out of atoms and to study electronic behaviour of matter. These objects do not occur in nature and therefore ...
Multi-tip scanning tunneling microscopy (Multi-tip STM) extends scanning tunneling microscopy (STM) from imaging to dedicated electrical measurements at the nanoscale like a ″multimeter at the nanoscale″. In materials science, nanoscience, and nanotechnology, it is desirable to measure electrical properties at a particular position of the ...
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