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  2. Transistor tester - Wikipedia

    en.wikipedia.org/wiki/Transistor_tester

    Transistor h fe varies fairly widely with Ic, so measurements with the service type tester give readings that can differ quite a bit from the h fe in the transistor's real life application. Hence these testers are useful, but can't be regarded as giving accurate real-life h fe values.

  3. Curve tracer - Wikipedia

    en.wikipedia.org/wiki/Curve_tracer

    In addition to the transistor characteristic curves, the Type 575 is used to display dynamic characteristics of a wide range of semiconductor devices." (Tektronix, Catalog, 1967) A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components , such as diodes , transistors ...

  4. Electronic test equipment - Wikipedia

    en.wikipedia.org/wiki/Electronic_test_equipment

    Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.

  5. 2N3055 - Wikipedia

    en.wikipedia.org/wiki/2N3055

    The 1967 RCA Transistor Manual, SC-13, did not mention any measure of high frequency performance for the 2N3055; by the 1971 SC-15 manual a transition frequency, f T, of at least 800 kHz was specified (at I C = 1 A) and f hfe (the frequency at which the small-signal current gain drops by 3 dB) was also specified at 1 A to be 10 kHz minimum.

  6. List of semiconductor scale examples - Wikipedia

    en.wikipedia.org/wiki/List_of_semiconductor...

    AMD began using TSMC 7 nm starting with the Vega 20 GPU in November 2018, [128] with Zen 2-based CPUs and APUs from July 2019, [129] and for both PlayStation 5 [130] and Xbox Series X/S [131] consoles' APUs, released both in November 2020.

  7. LCR meter - Wikipedia

    en.wikipedia.org/wiki/LCR_meter

    An LCR meter is a type of electronic test equipment used to measure the inductance (L), capacitance (C), and resistance (R) of an electronic component. [1] In the simpler versions of this instrument the impedance was measured internally and converted for display to the corresponding capacitance or inductance value. Readings should be reasonably ...

  8. TK-80 - Wikipedia

    en.wikipedia.org/wiki/TK-80

    He decided to document its manual with a circuit diagram and assembly code of the debug monitor, influenced by the PDP-8 which was an open architecture and was used as an IC tester at NEC. [1] [6] [7] TK-80 demonstrated controlling a model train at Bit-INN [8] Advert in Transistor Gijutsu Sep.1976. "The closest microcomputer with unlimited ...

  9. TL431 - Wikipedia

    en.wikipedia.org/wiki/TL431

    Reference voltage vs free-air temperature at test conditions. Design-center (middle plot) and worst-case deviation of ±2% (upper and lower plots) [12] The nominal reference voltage, V REF =2.495 V, stated in a datasheet, is tested in zener mode at an ambient temperature of +25 °C (77 °F), and I CA =10 mA. [13]