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  2. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.

  3. Category:Scanning probe microscopy - Wikipedia

    en.wikipedia.org/wiki/Category:Scanning_probe...

    Download as PDF; Printable version; In other projects ... This category contains articles about the different types of scanning probe microscopes and methods ...

  4. Scanning probe microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_probe_microscopy

    Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.

  5. Scanning Hall probe microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_Hall_probe_microscope

    Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. Developed in 1996 by Oral, Bending and Henini, [2] SHPM allows mapping the magnetic induction associated with a sample.

  6. Tip-enhanced Raman spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Tip-enhanced_Raman...

    Tip-enhanced Raman spectroscopy (TERS) is a variant of surface-enhanced Raman spectroscopy (SERS) [1] that combines scanning probe microscopy with Raman spectroscopy. High spatial resolution chemical imaging is possible via TERS, [2] with routine demonstrations of nanometer spatial resolution under ambient laboratory conditions, [3] or better [4] at ultralow temperatures and high pressure.

  7. Scanning ion-conductance microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_ion-conductance...

    Scanning ion-conductance microscopy diagram. Scanning ion-conductance microscopy (SICM) is a scanning probe microscopy technique that uses an electrode as the probe tip. [1] SICM allows for the determination of the surface topography of micrometer and even nanometer-range [2] structures in aqueous media conducting electrolytes. The samples can ...

  8. Scanning vibrating electrode technique - Wikipedia

    en.wikipedia.org/wiki/Scanning_vibrating...

    Scanning vibrating electrode technique was originally introduced to sensitively measure extracellular currents by Jaffe and Nuccitelli in 1974. [1] Jaffe and Nuccitelli then demonstrated the ability of the technique through the measurement of the extracellular currents involved with amputated and re-generating newt limbs, [5] developmental currents of chick embryos, [6] and the electrical ...

  9. Scanning electrochemical microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_electrochemical...

    Scanning electrochemical microscopy (SECM) is a technique within the broader class of scanning probe microscopy (SPM) that is used to measure the local electrochemical behavior of liquid/solid, liquid/gas and liquid/liquid interfaces.